"VLSI Self-Testing Based on Syndrome Techniques" by Zeev Barzilai

Selected Works of George Markowsky

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VLSI Self-Testing Based on Syndrome Techniques

Proceedings of the International Test Conference (1981, Philadelphia, PA)

Zeev Barzilai
Jacob Savir
George Markowsky, Missouri University of Science and Technology
Merlin G. Smith

Meeting Name

International Test Conference (1981: Oct., Philadelphia, PA)

Department(s)

Computer Science

Keywords and Phrases

Architecture,
IC Testing,
LSI,
Macros,
Self-testing,
Syndrome Techniques,
VLSI,
Weighted Syndromes,
Integrated Circuits

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

Publication Date

10-1-1981

Publication Date

01 Oct 1981

Disciplines

Computer Sciences

Citation Information

Zeev Barzilai, Jacob Savir, George Markowsky and Merlin G. Smith. "VLSI Self-Testing Based on Syndrome Techniques" Proceedings of the International Test Conference (1981, Philadelphia, PA) (1981) p. 102 - 109
Available at: http://works.bepress.com/george-markowsky/14/