Article
VLSI Self-Testing Based on Syndrome Techniques
Proceedings of the International Test Conference (1981, Philadelphia, PA)
Meeting Name
International Test Conference (1981: Oct., Philadelphia, PA)
Department(s)
Computer Science
Keywords and Phrases
- Architecture,
- IC Testing,
- LSI,
- Macros,
- Self-testing,
- Syndrome Techniques,
- VLSI,
- Weighted Syndromes,
- Integrated Circuits
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 1981 International Test Conference, All rights reserved.
Publication Date
10-1-1981
Publication Date
01 Oct 1981
Disciplines
Citation Information
Zeev Barzilai, Jacob Savir, George Markowsky and Merlin G. Smith. "VLSI Self-Testing Based on Syndrome Techniques" Proceedings of the International Test Conference (1981, Philadelphia, PA) (1981) p. 102 - 109 Available at: http://works.bepress.com/george-markowsky/14/