Article
Bounding Fault Detection Probabilities in Combinational Circuits
Journal of Electronic Testing
Abstract
This paper focuses on the problem of bounding fault detection probabilities in combinational circuits. Two algorithms, the complete cutting algorithm and the gate blocking algorithm, are presented that always produce true lower bounds on the detection probability of a fault. Both algorithms can be used to identify difficult-to-test faults and to quickly construct test sets for specific faults. Both algorithms have qualitative versions which provide insight into a circuit while avoiding arithmetic calculation. Both algorithms resulted from research in trying to determine the accuracy of the safety factor heuristic of Jacob Savir.
Department(s)
Computer Science
Keywords and Phrases
- Computer Programming--Algorithms,
- Probability,
- Bounding Probabilities,
- Safety Factor Heuristics,
- Logic Circuits,
- Combinatorial,
- detection probability,
- testing
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 1991 Springer Verlag, All rights reserved.
Publication Date
11-1-1991
Publication Date
01 Nov 1991
Disciplines
Citation Information
George Markowsky. "Bounding Fault Detection Probabilities in Combinational Circuits" Journal of Electronic Testing Vol. 2 Iss. 4 (1991) p. 315 - 323 ISSN: 0923-8174 Available at: http://works.bepress.com/george-markowsky/11/