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Terms and Concepts for Yield, Crop Loss, and Disease Thresholds
Plant Disease
  • Forrest W Nutter, Jr., Iowa State University
  • Paul S. Teng, International Rice Research Institute
  • Matthew H. Royer, United States Department of Agriculture
Document Type
Article
Publication Version
Published Version
Publication Date
2-1-1993
DOI
10.1094/PD-77-211
Abstract

The initial report (14) of a subcommittee of the APS Plant Disease Losses Committee dealt with terms and concepts relating to the measurement of disease intensity to obtain accurate and precise quantitative information on the relationship between disease intensity (stimulus = X) and yield or yield loss (response = Y). In addition to standardizing the terms and concepts for the measurement of disease intensity, members of the full committee identified a need to clarify and standardize terms and concepts pertaining to yield, crop loss, and disease thresholds. A second subcommittee was formed to accomplish this task. This report describes concepts concerning reference points for yield and crop loss as well as a hierarchy for threshold terms, then presents a list of terms and definitions to standardize terminology for crop loss assessment.

Comments

This article is from Plant Disease 77 (1993): 211, doi:10.1094/PD-77-211.

Rights
Works produced by employees of the U.S. Government as part of their official duties are not copyrighted within the U.S. The content of this document is not copyrighted.
Language
en
File Format
application/pdf
Citation Information
Forrest W Nutter, Paul S. Teng and Matthew H. Royer. "Terms and Concepts for Yield, Crop Loss, and Disease Thresholds" Plant Disease Vol. 77 (1993) p. 211 - 215
Available at: http://works.bepress.com/forrest_nutter/61/