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Electrical and Electron Paramagnetic Resonance Spectroscopy Characterization of Mn-doped Nanostructured TiO₂ For Capacitor Applications
Journal of Power Sources
  • Rafael Vazquez-Reina
  • Sheng Chao
  • Vladimir Petrovsky
  • Fatih Dogan, Missouri University of Science and Technology
  • Steven Greenbaum
Abstract

Nanostructured TiO2 has shown promise as a dielectric material for high energy density ceramic capacitors because of its high dielectric breakdown strength and dielectric constant. Strategies to increase the insulation resistance or to reduce the leakage current of TiO2 include doping with transition metal ions. It is shown that Mn doping followed by an appropriate thermal treatment increases the grain boundary resistivity significantly and lowers the dielectric loss. Electrical measurements along with electron paramagnetic resonance and scanning electron microscopy of Mn-doped nanoscopic TiO2 demonstrate that sintering at 900 °C leads to optimal electrical properties that are correlated with a non-uniform distribution of dopant ions, concentrated at the grain boundaries. Nanostructured TiO2 dielectrics with improved insulation resistance are promising for the development of higher energy density capacitors.

Department(s)
Materials Science and Engineering
Keywords and Phrases
  • Capacitors,
  • Nanostructured TiO2,
  • Insulation Resistance,
  • Electron Paramagnetic Resonance (EPR)
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2012 Elsevier, All rights reserved.
Publication Date
7-1-2012
Publication Date
01 Jul 2012
Citation Information
Rafael Vazquez-Reina, Sheng Chao, Vladimir Petrovsky, Fatih Dogan, et al.. "Electrical and Electron Paramagnetic Resonance Spectroscopy Characterization of Mn-doped Nanostructured TiO₂ For Capacitor Applications" Journal of Power Sources (2012) ISSN: 0378-7753
Available at: http://works.bepress.com/fatih-dogan/69/