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Article
Vanadium Doped Nanostructured TiO₂ Dielectrics
Proceedings of the Materials Research Society (MRS) Symposium Fall Meeting (2013, Boston, MA)
  • Fatih Dogan, Missouri University of Science and Technology
  • Sheng Chao
  • Jing Peng
  • Steven G. Greenbaum
Abstract

Dielectric properties of titanium oxide ceramics are strongly influenced by the microstructural features and concentration of dopants and impurity ions. Electrical conductivity (via insulation resistance) of vanadium doped nanostructured titanium dioxide (TiO2) ceramics was measured as a function of donor concentration and temperature. In order to further clarify the effect of the dopants on the microstructural development and resultant dielectric properties of TiO2, electron paramagnetic resonance (EPR) spectroscopy was employed. Vanadium-doped TiO2 exhibited well-defined hyperfine splitting characteristics of the 51V nuclei indicating that the dopant ions are dispersed within the grains and not preferentially segregated at the grain boundaries.

Meeting Name
Materials Research Society (MRS) Symposium Fall Meeting (2013: Dec. 1-6, Boston, MA)
Department(s)
Materials Science and Engineering
Keywords and Phrases
  • ceramic,
  • dielectric properties,
  • nanostructure,
  • Ceramic materials,
  • Electron spin resonance spectroscopy,
  • Grain boundaries,
  • Magnetic resonance,
  • Microstructural evolution
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2014 Materials Research Society (MRS), All rights reserved.
Publication Date
1-1-2014
Publication Date
01 Jan 2014
Citation Information
Fatih Dogan, Sheng Chao, Jing Peng and Steven G. Greenbaum. "Vanadium Doped Nanostructured TiO₂ Dielectrics" Proceedings of the Materials Research Society (MRS) Symposium Fall Meeting (2013, Boston, MA) Vol. 1645 (2014) ISSN: 0272-9172
Available at: http://works.bepress.com/fatih-dogan/227/