Article
Microstructural Characterization of Sputter Deposited BaTiO₃/Ni/BaTiO₃/Ni/BaTiO₃ Multi-Layer Thin Films on SiO₂/Si Wafers
Microscopy and Microanalysis
Meeting Name
Microscopy and Microanalysis 2009 (2009: Jul. 26-30, Richmond, VA)
Department(s)
Materials Science and Engineering
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2009 Cambridge University Press , All rights reserved.
Publication Date
7-1-2009
Publication Date
01 Jul 2009
Disciplines
Citation Information
M. Zhang, J. N. Reck, F. Scott Miller and Matthew O'Keefe. "Microstructural Characterization of Sputter Deposited BaTiO₃/Ni/BaTiO₃/Ni/BaTiO₃ Multi-Layer Thin Films on SiO₂/Si Wafers" Microscopy and Microanalysis Vol. 15 Iss. SUPPL. 2 (2009) p. 1224 - 1225 ISSN: 1431-9276; 1435-8115 Available at: http://works.bepress.com/f-miller/20/