Analytical method using modified scanning probesIowa State University Patents
AbstractThe present invention provides a method of analyzing for a specific material in a sample using a sensor including a resonating member having resonating properties. The resonating member has a probe and a known material is disposed on or forms the probe. The method includes the steps of positioning the sensor proximate to the sample, detecting a force dependent change in the resonance properties of the sensor, and confirming the presence of the specific material based on the identity of the known material and the detection of a resonance change.
Patent NumberUS 5,763,768
ISURF Reference Number
AssigneeIowa State University Research Foundation, Inc.,
Application NumberUS 08/819,667
Citation InformationEric R. Henderson, Curtis L. Mosher, Vivian Wynne Jones, John-Bruce D. Green, et al.. "Analytical method using modified scanning probes" (1998)
Available at: http://works.bepress.com/eric-henderson/3/