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Article
Atomic force microscopy and manipulation of living glial cells
Journal of Vacuum Science & Technology A
  • V. Parpura, Iowa State University
  • P. G. Haydon, Iowa State University
  • D. S. Sakaguchi, Iowa State University
  • E. Henderson, Iowa State University
Document Type
Article
Publication Version
Published Version
Publication Date
1-1-1993
DOI
10.1116/1.578346
Abstract

The atomic force microscope (AFM) is capable of imaging surfaces at very high resolution. The AFM has been used to image living glial cells in culture. Typical images reveal the three‐dimensional shape of the cell and often internal cellular structures are visible. In this report, it is shown that by increasing the imaging force, cells can be removed from the surface on which they are grown. Although the forces involved in this process are complex, it is possible to compare relative adhesion of different types of living cells to a particular substrate.

Comments

This article is from Journal of Vacuum Science & Technology A 11 (1993): 773, doi: 10.1116/1.578346. Posted with permission.

Copyright Owner
American Vacuum Society
Language
en
File Format
application/pdf
Citation Information
V. Parpura, P. G. Haydon, D. S. Sakaguchi and E. Henderson. "Atomic force microscopy and manipulation of living glial cells" Journal of Vacuum Science & Technology A Vol. 11 Iss. 4 (1993) p. 773 - 775
Available at: http://works.bepress.com/eric-henderson/20/