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P3HT (poly (3‐hexylthiophene)) has been widely used as a donor in the active layer in organic photovoltaic devices. Although moderately high‐power conversion efficiencies have been achieved with P3HT‐based devices, structural details, such as the orientation of polymer units and the extent of H‐ and J‐aggregation are not yet fully understood; and different measures have been taken to control the ordering in the material. One such measure, which has been exploited, is to apply an electric field from a Van de Graaff generator. Fluorescence (to measure anisotropy instead of polarization, which is more commonly measured) and Raman spectroscopy are used to characterize the order of P3HT molecules in thin films resulting from the field. Preferential orientations of the units in a thin film are determined, consistent with observed hole mobility in thin‐film transistors, and it is observed that the apparent H‐coupling strength changes when the films are exposed to oriented electrical fields during drying.
Available at: http://works.bepress.com/emily-smith/29/
This is the peer-reviewed version of the following article: Bhattacharjee, Ujjal, Moneim Elshobaki, Kalyan Santra, Jonathan M. Bobbitt, Sumit Chaudhary, Emily A. Smith, and Jacob W. Petrich. "Characterizing Electric Field Exposed P3HT Thin Films Using Polarized‐Light Spectroscopies." Macromolecular Chemistry and Physics 217, no. 16 (2016): 1801-1809 which has been published in final form at doi: 10.1002/macp.201600113. This article may be used for non-commercial purposes in accordance with Wiley Terms and Conditions for Self-Archiving. Posted with permission.