As the data rate and density of digital high-speed systems are getting higher, far-end crosstalk (FEXT) noise becomes one of the major issues that limit signal integrity performance. It was commonly believed that FEXT would be eliminated for strip lines routed in a homogeneous dielectric, but in reality, FEXT can always be measured in strip lines on the fabricated printed circuit boards. A slightly different dielectric permittivity (ϵr) of prepreg and core may be one of the major contributors to the FEXT. This article is focusing on providing a practical FEXT modeling methodology for strip lines by introducing an approach to extract ϵr of prepreg and core. Using the known cross-sectional geometry and measured S-parameters of the coupled strip line, the capacitance components in prepreg and core are separated using a two-dimensional solver, and the ϵr of prepreg and core is determined. A more comprehensive FEXT modeling approach is proposed by applying extracted inhomogeneous dielectric material information.