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Article
Eye-Diagram Estimation with Stochastic Model for 8B/10B Encoded High-Speed Channel
Proceedings of the 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (2018, Singapore)
  • Junyong Park
  • DongHyun Kim, Missouri University of Science and Technology
  • Youngwoo Kim
  • Sumin Choi
  • Joungho Kim
Abstract

This paper proposes an eye-diagram estimation method for 8B/10B encoded channel. The stochastic model describes the encoder with respect to probability, which replaces the practical encoder. Because the 8B/10B encoder consists of 3-to-4 and 5-to-6 look-up-table (LUTs), they can be represented as its own stochastic model. For verification, we compare the statistical eye-diagram by the proposed method and the SPICE at the same data rate. The changes on the eye-diagram for both cases are nearly the same by the encoder. Therefore, the proposed method successfully achieves the eye-diagram evaluation for the 8B/10B encoded high-speed channel.

Meeting Name
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 (2018: May 14-18, Singapore)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • 8B/10B encoding,
  • Double edge response (DER),
  • Eye-diagram,
  • Eye-diagram estimation,
  • High-speed serial link,
  • Stochastic model
International Standard Book Number (ISBN)
978-150905997-3
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
5-1-2018
Publication Date
01 May 2018
Citation Information
Junyong Park, DongHyun Kim, Youngwoo Kim, Sumin Choi, et al.. "Eye-Diagram Estimation with Stochastic Model for 8B/10B Encoded High-Speed Channel" Proceedings of the 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (2018, Singapore) (2018) p. 1 - 5
Available at: http://works.bepress.com/donghyun-bill-kim/19/