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Article
Harmonic and power balance tools for tapping-mode atomic force microscope
Journal of Applied Physics
  • A. Sebastian, Iowa State University
  • M. V. Salapaka, Iowa State University
  • Degang J. Chen, Iowa State University
  • J. P. Cleveland, Asylum Research
Document Type
Article
Publication Date
6-1-2001
DOI
10.1063/1.1365440
Abstract
The atomic force microscope(AFM) is a powerful tool for investigating surfaces at atomic scales. Harmonic balance and power balance techniques are introduced to analyze the tapping-mode dynamics of the atomic force microscope. The harmonic balance perspective explains observations hitherto unexplained in the AFM literature. A nonconservative model for the cantilever–sample interaction is developed. The energy dissipation in the sample is studied and the resulting power balance equations combined with the harmonic balance equations are used to estimate the model parameters. Experimental results confirm that the harmonic and power balance tools can be used effectively to predict the behavior of the tapping cantilever.
Comments

The following article appeared in Journal of Applied Physics 89, 6473 (2001); and may be found at doi: 10.1063/1.1365440.

Rights
Copyright 2001 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Copyright Owner
American Institute of Physics
Language
en
File Format
application/pdf
Citation Information
A. Sebastian, M. V. Salapaka, Degang J. Chen and J. P. Cleveland. "Harmonic and power balance tools for tapping-mode atomic force microscope" Journal of Applied Physics Vol. 89 Iss. 11 (2001) p. 6473 - 6480
Available at: http://works.bepress.com/degang-chen/4/