Research and development of displays and image sensors based on semiconducting polymers require design of new polymer materials and evaluation of film properties. Application of statistical methods can expedite process development. Optimizing device performance entails determining the effect of several process parameters, necessitates numerous samples, and may consume more scarce new material than desired. Uniform film thickness, with no voids, pinholes, inhomogeneities, or particulate contamination across the substrate can improve display efficiency and uniformity. After performing and analyzing a two-cubed full-factorial experiment with three replicated center points, this paper concludes that spin velocity and polymer concentration have statistically significant effects on film thickness, film uniformity, and device efficiency. Ramp acceleration does not. Analysis of variance methodology determines the effect of the three spin coating factors and their two-way interactions.
Available at: http://works.bepress.com/dbraun/13/