"X-Ray Line Broadening Characterization of Strain Inhomogeneity in Textured Copper" by David D. Sam

Selected Works of David D. Sam

Presentation

X-Ray Line Broadening Characterization of Strain Inhomogeneity in Textured Copper

TMS Fall Meeting (Materials Week 1984): Symposium on Deformation

David D. Sam, Utah State University

Document Type

Presentation

Publication Date

1-1-1984

Disciplines

Aerospace Engineering,
Engineering and
Mechanical Engineering

Comments

Detroit, Michigan

Citation Information

“X-Ray Line Broadening Characterization of Strain Inhomogeneity in Textured Copper”, TMS Fall Meeting (Materials Week 1984): Symposium on Deformation, Detroit, MI, September 1984.