Article
Depletion Width and Capacitance Transient formulas for Deep Traps of High-Concentration
Journal of Applied Physics
Document Type
Article
Publication Date
8-1-1995
Disciplines
Abstract
We derive expressions for the depletion width and capacitance transient applicable to traps which may be deep and of high concentration. The new results are compared with those obtained from the commonly used formulas, and also from an exact analysis. Experimental deep level transient spectroscopic data for EL2 in GaAs are in good agreement.
DOI
10.1063/1.360086
Citation Information
David C. Look and J. R. Sizelove. "Depletion Width and Capacitance Transient formulas for Deep Traps of High-Concentration" Journal of Applied Physics Vol. 78 Iss. 4 (1995) p. 2848 - 2850 ISSN: 0021-8979 Available at: http://works.bepress.com/david_look/77/
Copyright © 1995, American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in the Journal of Applied Physics 78.4, and may be found at http://jap.aip.org/resource/1/japiau/v78/i4/p2848_s1