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Article
The Electrical Characterization of Semi‐Insulating GaAs: A Correlation With Mass‐Spectrographic Analysis
Journal of Applied Physics
  • David C. Look, Wright State University - Main Campus
Document Type
Article
Publication Date
12-1-1977
Abstract

The room‐temperature electrical properties of 28 semi‐insulating GaAs crystals have been determined by using a mixed‐conductivity analysis. It is shown that for most of these samples, such an analysis gives good accuracy for the electron mobility μn and electron concentration n, but poorer accuracy for the hole mobility μp, hole concentration p, and intrinsic concentration ni. The intrinsic concentration is determined at 296 °K to be ni (1.7±0.4) ×106 cm−3, which compares favorably with the theoretical value deduced from the band gap and the effective masses. From a Fermi‐level analysis, the dominant Cr acceptor is found to lie at 0.69±0.02 eV from the valence band. For many of the samples, the ionized‐impurity concentrations NI have been estimated from spark‐source mass‐spectrographic measurements and are compared with the concentrations predicted from μn. In general, the expected inverse relationship between μn and NI is found to hold, but the scatter in the data is quite large, mainly due to the uncertainties in the mass‐spectrographic results.

Comments

Copyright © 1977, American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in the Journal of Applied Physics 48.12, and may be found at http://dx.doi.org/10.1063/1.323593.

DOI
10.1063/1.323593
Citation Information
David C. Look. "The Electrical Characterization of Semi‐Insulating GaAs: A Correlation With Mass‐Spectrographic Analysis" Journal of Applied Physics Vol. 48 Iss. 12 (1977) p. 5141 - 5148 ISSN: 0021-8979
Available at: http://works.bepress.com/david_look/432/