Skip to main content
Book
GaN and Related Alloys - 2001: Volume 693
Books Authored by Wright State Faculty/Staff
  • John E. Northrup
  • Jörg Neugebauer
  • David C. Look, Wright State University - Main Campus
  • Shigefusa F. Chichibu
  • Henning Riechert
Document Type
Book
Description

This book focuses on three main themes. Theme one - advances in basic science. Point defects, dislocations, doping, the properties of nitride alloys with a special emphasis on localization phenomena and GaAsN alloys (which are very promising for long-wavelength emitters), transport and optical properties are also featured. Theme two - growth and growth-related issues. Significant advances have been made in understanding/improving all major nitride growth techniques (MBE, MOCVD, HVPE). Techniques such as ELOG and the development of bulk-like substrates are receiving attention as methods to reduce the number of dislocations. Theme three - devices. Tremendous progress has been reported in device design and optimization, and also in understanding device processing issues such as p-contacts, laser lift-off, and etching. Overall, the book offers a broad exchange of scientific knowledge and technical expertise. Topics include: molecular beam epitaxy and growth kinetics; point defects and doping; light emitters; nitride alloys and lateral epitaxy; quantum wells; transport and optical properties; vapor phase epitaxy; extended defects; electronic devices and processing.

Publication Date
1-1-2002
Find in a Library
Catalog Record
Publisher
Materials Research Society
Keywords
  • Molecular Beam Epitaxy,
  • Growth Kinetics,
  • Point Defects,
  • Doping,
  • Light Emitters,
  • Nitride Alloys,
  • Lateral Epitaxy,
  • Quantum Wells,
  • Transport and Optical Properties,
  • Vapor Phase Epitaxy,
  • Extended Defects,
  • Electronic Devices and Processing
Citation Information
John E. Northrup, Jörg Neugebauer, David C. Look, Shigefusa F. Chichibu, et al.. GaN and Related Alloys - 2001: Volume 693. Warrendale(2002)
Available at: http://works.bepress.com/david_look/397/