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Article
A Study of the Transition from High to Low-Resistivity in As-Grown GaAs MBE Material
Journal of Electronic Materials
  • C. E. Stutz
  • David C. Look, Wright State University - Main Campus
  • E. N. Taylor
  • J. R. Sizelove
  • Phil W. Yu
Document Type
Article
Publication Date
1-1-1995
Abstract

This work discusses the transition from high resistivity as-grown GaAs layers to thermally metastable low resistivity as-grown layers by molecular beam epitaxy. This transition occurs at about 430 degrees C and coincides with a reflective high energy electron diffraction reconstruction change from a 2 x 1 to 2 x 4 pattern for an As-4/Ga beam equivalent pressure ratio of 20. For growth temperatures in the range 350 to 430 degrees C, room temperature Hall-effect measurements have shown resistivities of >10(7) ohm-cm and photoluminescence has shown new peaks at 0.747 eV and a band from 0.708 to 0.716 eV at 4.2K, in unannealed material.

DOI
10.1007/BF02659723
Citation Information
C. E. Stutz, David C. Look, E. N. Taylor, J. R. Sizelove, et al.. "A Study of the Transition from High to Low-Resistivity in As-Grown GaAs MBE Material" Journal of Electronic Materials Vol. 24 Iss. 1 (1995) p. 31 - 34 ISSN: 0361-5235
Available at: http://works.bepress.com/david_look/292/