"Schottky-Barrier Mobility Profiling Measurements With Gate-Current Corrections" by David C. Look

Selected Works of David C. Look

Article

Schottky-Barrier Mobility Profiling Measurements With Gate-Current Corrections

Solid-State Electronics

David C. Look, Wright State University - Main Campus
T. A. Cooper

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Document Type

Article

Publication Date

5-1-1985

Disciplines

Physical Sciences and Mathematics and
Physics

DOI

10.1016/0038-1101(85)90117-0

Citation Information

David C. Look and T. A. Cooper. "Schottky-Barrier Mobility Profiling Measurements With Gate-Current Corrections" Solid-State Electronics Vol. 28 Iss. 5 (1985) p. 521 - 527 ISSN: 0038-1101
Available at: http://works.bepress.com/david_look/269/