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Article
Excess Dark Current Due to Saw Damage in Semi-insulating GaAs
Journal of Electronic Materials
  • Z-Q. Fang
  • C. Look, Wright State University - Main Campus
Document Type
Article
Publication Date
1-1-1993
Abstract

Logarithmic plots of current or carrier concentration vs inverse temperature in semi-insulating GaAs samples are nearly always well characterized by straight lines with a donor activation energy of 0.76 +/- 0.02 eV, as long as the surfaces are well polished or etched and the edges are cleaved. However, edges cut with common dicing saws produce an excess conductance which can dominate the bulk conductance at room temperature and below. This excess conductance is due to carrier hopping between defects in a surface layer of approximately 2000angstrom thickness, which can be easily removed by etching. Some polished surfaces also exhibit this same effect.

DOI
10.1007/BF02817700
Citation Information
Z-Q. Fang and C. Look. "Excess Dark Current Due to Saw Damage in Semi-insulating GaAs" Journal of Electronic Materials Vol. 22 Iss. 11 (1993) p. 1361 - 1363 ISSN: 0361-5235
Available at: http://works.bepress.com/david_look/251/