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Article
The Path To ZnO Devices: Donor and Acceptor Dynamics
Physica Status Solidi A-Applied Research
  • David C. Look, Wright State University - Main Campus
  • R. L. Jones
  • J. R. Sizelove
  • Nelson Y. Garces
  • Nancy C. Giles
  • Larry E. Halliburton
Document Type
Article
Publication Date
1-1-2003
Abstract

Hall-effect, photoluminescence (PL), and electron paramagnetic resonance (EPR) measurements have been performed in single-crystal ZnO samples annealed in air at 25, 550, 750, and 950 degreesC, for 30 min each. A 37 meV donor is dominant in the unannealed sample, but nearly disappears during the higher temperature anneals, and is replaced by a 67 meV donor. The 37 meV donor is responsible for a donor-bound-exciton PL line at (3.3631 +/- 0.0002) eV, which is dominant in the unannealed sample. The EPR measurements show that N-O centers appear in the 750 degreesC and 950 degreesC anneals, and they are probably responsible for an increase in the acceptor concentration found from the Hall-effect results. A PL emission at (3.3570 +/- 0.0002) eV, assigned in the literature as an acceptor-bound exciton, may involve N-O complexes.

DOI
10.1002/pssa.200306274
Citation Information
David C. Look, R. L. Jones, J. R. Sizelove, Nelson Y. Garces, et al.. "The Path To ZnO Devices: Donor and Acceptor Dynamics" Physica Status Solidi A-Applied Research Vol. 195 Iss. 1 (2003) p. 171 - 177 ISSN: 0031-8965
Available at: http://works.bepress.com/david_look/250/