"Mobility Measurements with a Standard Contact Resistance Pattern" by C. Look

Selected Works of David C. Look

Article

Mobility Measurements with a Standard Contact Resistance Pattern

IEEE Electron Device Letters

C. Look, Wright State University - Main Campus

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Document Type

Article

Publication Date

4-1-1987

Disciplines

Physical Sciences and Mathematics and
Physics

DOI

10.1109/EDL.1987.26588

Citation Information

C. Look. "Mobility Measurements with a Standard Contact Resistance Pattern" IEEE Electron Device Letters Vol. 8 Iss. 4 (1987) p. 162 - 164 ISSN: 0741-3106
Available at: http://works.bepress.com/david_look/244/