Article
A 2-Layer Magneto-TLM Contact Resistance Model - Application to Modulation-Doped FET Structures
IEEE Transactions on Electron Devices
Document Type
Article
Publication Date
2-1-1988
Disciplines
DOI
10.1109/16.2431
Citation Information
David C. Look. "A 2-Layer Magneto-TLM Contact Resistance Model - Application to Modulation-Doped FET Structures" IEEE Transactions on Electron Devices Vol. 35 Iss. 2 (1988) p. 133 - 138 ISSN: 0018-9383 Available at: http://works.bepress.com/david_look/234/