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Article
Time-Resolved Photoluminescence Lifetime Measurements of the Gamma(5) and Gamma(6) Free Excitons in ZnO
Journal of Applied Physics
Document Type
Article
Publication Date
8-1-2000
Disciplines
Abstract
Time-resolved photoluminescence spectroscopy at 2 K was used to measure the radiative recombination lifetime of the allowed (Γ5) and forbidden (Γ6) free excitons in ZnO. The measurements were made on a sample containing internal strain, which altered the sample symmetry, and resulted in relaxed selection rules, allowing the Γ6 exciton to be observed. A radiative recombination lifetime of 259 ps was measured for the Γ5 exciton and 245 ps for the Γ6 exciton. The decay of the free excitons was of single-exponential form, and the decay times were obtained using a least-squares fit of the data.
DOI
10.1063/1.1305546
Citation Information
D. C. Reynolds, David C. Look, B. Jogai, J. E. Hoelscher, et al.. "Time-Resolved Photoluminescence Lifetime Measurements of the Gamma(5) and Gamma(6) Free Excitons in ZnO" Journal of Applied Physics Vol. 88 Iss. 4 (2000) p. 2152 - 2153 ISSN: 0021-8979 Available at: http://works.bepress.com/david_look/161/
Copyright © 2000, American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in the Journal of Applied Physics 88.4, and may be found at http://jap.aip.org/resource/1/japiau/v88/i4/p2152_s1