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Article
Perceptions, expectations, and challenges in defect prediction
IEEE Transactions on Software Engineering
  • Zhiyuan WAN, Zhejiang University
  • Xin XIA, Monash University
  • Ahmed E. HASSAN, Queen's University
  • David LO, Singapore Management University
  • Jianwei YIN, Zhejiang University
  • Xiaohu YANG, Zhejiang University
Publication Type
Journal Article
Version
acceptedVersion
Publication Date
11-2020
Abstract

Defect prediction has been an active research area for over four decades. Despite numerous studies on defect prediction, the potential value of defect prediction in practice remains unclear. To address this issue, we performed a mixed qualitative and quantitative study to investigate what practitioners think, behave and expect in contrast to research findings when it comes to defect prediction. We collected hypotheses from open-ended interviews and a literature review, followed by a validation survey. We received 395 responses from practitioners. Some of our key findings include: 1) Over 90% of respondents are willing to adopt defect prediction techniques. 2) There exists a disconnect between practitioners' perceptions and well supported research evidence regarding defect density distribution and the relationship between file size and defectiveness. 3) 7.2% of the respondents reveal an inconsistency between their behavior and perception regarding defect prediction. 4) Defect prediction at the feature level is the most preferred level of granularity by practitioners. 5) During bug fixing, more than 40% of the respondents acknowledged that they would make a "work-around" fix rather than correct the actual error-causing code. Based on our findings, we highlight future research directions and provide recommendations for practitioners.

Keywords
  • Interviews,
  • Practitioner,
  • Defect Prediction,
  • Empirical Study,
  • Tools,
  • Software,
  • Survey,
  • Computer bugs
Identifier
10.1109/TSE.2018.2877678
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Copyright Owner and License
Authors
Creative Commons License
Creative Commons Attribution-NonCommercial-No Derivative Works 4.0 International
Additional URL
https://doi.org/10.1109/TSE.2018.2877678
Citation Information
Zhiyuan WAN, Xin XIA, Ahmed E. HASSAN, David LO, et al.. "Perceptions, expectations, and challenges in defect prediction" IEEE Transactions on Software Engineering Vol. 46 Iss. 11 (2020) p. 1241 - 1266 ISSN: 0098-5589
Available at: http://works.bepress.com/david_lo/303/