Magnetotransport study of (Sb1−xBix)2Te3 thin films on mica substrate for ideal topological insulator

Thumbnail Image
Date
2016-01-01
Authors
Ni, Yan
Zhang, Zhen
Nlebedim, Cajetan
Jiles, David
Major Professor
Advisor
Committee Member
Journal Title
Journal ISSN
Volume Title
Publisher
Authors
Person
Jiles, David
Distinguished Professor Emeritus
Research Projects
Organizational Units
Organizational Unit
Organizational Unit
Journal Issue
Is Version Of
Versions
Series
Department
Ames National LaboratoryElectrical and Computer Engineering
Abstract

We deposited high quality (Sb1−xBix)2Te3 on mica substrate by molecular beam epitaxy and investigated their magnetotransport properties. It is found that the average surface roughness of thin films is lower than 2 nm. Moreover, a local maxima on the sheet resistance is obtained with x = 0.043, indicating a minimization of bulk conductivity at this composition. For (Sb0.957Bi0.043)2Te3, weak antilocalization with coefficient of -0.43 is observed, confirming the existence of 2D surface states. Moreover Shubnikov-de Hass oscillation behavior occurs under high magnetic field. The 2D carrier density is then determined as 0.81 × 1016 m−2, which is lower than that of most TIs reported previously, indicating that (Sb0.957Bi0.043)2Te3 is close to ideal TI composition of which the Dirac point and Fermi surface cross within the bulk bandgap. Our results thus demonstrate the best estimated composition for ideal TI is close to (Sb0.957Bi0.043)2Te3 and will be helpful for designing TI-based devices.

Comments

The following article appeared in AIP Advances 6, 055812 (2016) and may be found at http://dx.doi.org/10.1063/1.4943156.

Description
Keywords
Citation
DOI
Copyright
Fri Jan 01 00:00:00 UTC 2016
Collections