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Article
Comprehensive analysis of Barkhausen emission spectra using pulse height analysis, frequency spectrum, and pulse wave form analysis
Journal of Applied Physics
  • Levent B. Sipahi, Iowa State University
  • David C. Jiles, Iowa State University
  • D. Chandler, Iowa State University
Document Type
Article
Publication Date
5-15-1993
DOI
10.1063/1.353617
Abstract
The dependence of magnetic Barkhausen emissions (MBE) upon both field excitation and detection frequencies and excitation wave form was studied in order to investigate two of several crucial factors which affect the emissions. Sinusoidal, triangular, and square wave forms were used to generate the MBE and the pulse height spectra, frequency spectra, and pulse wave forms of these signals were analyzed. The frequency spectra of sinusoidal and triangular alternating field excitations showed similar behavior but the spectrum under square wave excitation was different due to the existence of high frequency components during square wave switching. As yet, no common standard has been agreed upon for parameterization and representation of Barkhausen signals. It appears from this work that field excitation wave form and frequency should define the inputs, while detection frequency range, pulse height spectrum, frequency spectrum, and emitted pulse wave form analysis should be used to quantify the output.
Comments

The following article appeared in Journal of Applied Physics 73 (1993): 5623 and may be found at http://dx.doi.org/10.1063/1.353617.

Rights
Copyright 1993 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Copyright Owner
American Institute of Physics
Language
en
Date Available
2014-08-22
File Format
application/pdf
Citation Information
Levent B. Sipahi, David C. Jiles and D. Chandler. "Comprehensive analysis of Barkhausen emission spectra using pulse height analysis, frequency spectrum, and pulse wave form analysis" Journal of Applied Physics Vol. 73 Iss. 10 (1993) p. 5623 - 5625
Available at: http://works.bepress.com/david_jiles/123/