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Article
ESD Excitation Model for Susceptibility Study
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC 2003
  • Federico Centola
  • David Pommerenke, Missouri University of Science and Technology
  • Kai Wang
  • Thomas Van Doren, Missouri University of Science and Technology
  • Spartaco Caniggia
Abstract
The paper provides a simplified model of a known ESD generator that allows modeling the ESD impulses (current and fields) in CST-Microwave Studio. The model is suitable for simulating the excitation of structures by ESD, but it is not intended to predict the fields and current of an ESD generator for its development purpose. The aim is to simultaneously model the ESD generator and a susceptible structure with as few details as possible but to obtain as good a match on current and fields as possible.
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC 2003
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • CST-Microwave Studio,
  • ESD Generator,
  • Circuit Simulation,
  • Electrostatic Devices,
  • Integrated Circuit Modelling,
  • Numerical Modeling
Library of Congress Subject Headings
Electrostatic discharges
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2003 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2003
Citation Information
Federico Centola, David Pommerenke, Kai Wang, Thomas Van Doren, et al.. "ESD Excitation Model for Susceptibility Study" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC 2003 (2003)
Available at: http://works.bepress.com/david-pommerenke/92/