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Article
A Measurement Technique for ESD Current Spreading on a PCB Using Near Field Scanning
IEEE International Symposium on Electromagnetic Compatibility, 2009. EMC 2009
  • Wei Huang
  • David Pommerenke, Missouri University of Science and Technology
  • Jiang Xiao
  • Dazhao Liu
  • Jin Min
  • Giorgi Muchaidze
  • Soon Jae Kwon
  • Ki Hyuk Kim
Department(s)
Electrical and Computer Engineering
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2009
Citation Information
Wei Huang, David Pommerenke, Jiang Xiao, Dazhao Liu, et al.. "A Measurement Technique for ESD Current Spreading on a PCB Using Near Field Scanning" IEEE International Symposium on Electromagnetic Compatibility, 2009. EMC 2009 (2009)
Available at: http://works.bepress.com/david-pommerenke/9/