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Article
Developing a Universal Exchange Format for Near-field Scan Data
IEEE International Symposium on Electromagnetic Compatibility, 2009. EMC 2009
  • John Shepherd
  • Atsushi Nakamura
  • Frederic Lafon
  • Etienne Sicard
  • Mohamed Ramdani
  • David Pommerenke, Missouri University of Science and Technology
  • Giorgi Muchaidze
  • Sebastien Serpaud
Department(s)
Electrical and Computer Engineering
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2009
Citation Information
John Shepherd, Atsushi Nakamura, Frederic Lafon, Etienne Sicard, et al.. "Developing a Universal Exchange Format for Near-field Scan Data" IEEE International Symposium on Electromagnetic Compatibility, 2009. EMC 2009 (2009)
Available at: http://works.bepress.com/david-pommerenke/77/