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Dependence of ESD Charge Voltage on Humidity in Data Centers: Part III - Estimation of ESD-Related Risk in Data Centers using Voltage Level Extrapolation and Chebyshev's Inequality
ASHRAE Transactions
  • Xu Gao
  • Atieh Talebzadeh
  • Mahdi Moradian
  • Yunan Han
  • David E. Swenson
  • David Pommerenke, Missouri University of Science and Technology
Abstract
This paper is the third in a series that investigates the electrostatic discharge (ESD)-related voltages and risks in data centers. This paper analyzes the risk of damage or upset under the following environmental conditions: 45% relative humidity (RH), 25% RH, and 8% RH at 27°C, and 8% RH at 38°C. The main purpose of this study is to evaluate the increase of ESD-related upsets or failures caused by reducing the RH from 25% to 8%. The pattern walking test, random walking test, and extrapolation method described by Moradian et al. (2014) are used in this paper. As the distribution function of the tribo-charging-induced voltage is not directly known, Chebyshev's inequality is used to predict the upper bound for the probability of ESD-related failures.
Meeting Name
2015 ASHRAE Winter Conference (2015: Jan. 24-28, Chicago, IL)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Distribution functions,
  • Electrostatic discharge,
  • Extrapolation,
  • Probability distributions,
  • Random processes,
  • Risk perception,
  • Charge voltage,
  • Chebyshev's inequality,
  • Environmental conditions,
  • Extrapolation methods,
  • Induced voltages,
  • Risk of damage,
  • Tribocharging,
  • Voltage levels,
  • Electrostatic devices
International Standard Book Number (ISBN)
978-193650496-1
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 American Society of Heating, Refrigerating and Air-Conditioning Engineers (ASHRAE) , All rights reserved.
Publication Date
1-1-2015
Citation Information
Xu Gao, Atieh Talebzadeh, Mahdi Moradian, Yunan Han, et al.. "Dependence of ESD Charge Voltage on Humidity in Data Centers: Part III - Estimation of ESD-Related Risk in Data Centers using Voltage Level Extrapolation and Chebyshev's Inequality" ASHRAE Transactions Vol. 121 (2015) p. 49 - 57 ISSN: 0001-2505
Available at: http://works.bepress.com/david-pommerenke/74/