Skip to main content
Article
2D Imaging System with Optical Tracking for EMI Source Localization
Proceedings of the 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity (2015, Santa Clara, CA)
  • Hui He
  • Victor Khilkevich, Missouri University of Science and Technology
  • David Pommerenke, Missouri University of Science and Technology
Abstract
This research presents a 2D imaging system with optical tracking to localize radiating sources. Optical tracking system is used for localizing the position of the near field measurement probe. Emission source microscopy (ESM) algorithm derived from synthetic aperture radar (SAR) technique is used to localize radiating sources.
Meeting Name
2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity (2015: Mar. 15-21, Santa Clara, CA)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Imaging systems,
  • EMI,
  • ESM,
  • Near-field scanning,
  • Optical tracking,
  • SAR,
  • Source localization,
  • Synthetic aperture radar
International Standard Book Number (ISBN)
978-147991991-8
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
5-1-2015
Citation Information
Hui He, Victor Khilkevich and David Pommerenke. "2D Imaging System with Optical Tracking for EMI Source Localization" Proceedings of the 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity (2015, Santa Clara, CA) (2015) p. 107 - 110
Available at: http://works.bepress.com/david-pommerenke/5/