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Article
Application of Emission Source Microscopy Technique to EMI Source Localization above 5 GHz
Proceedings of the 2014 IEEE International Symposium on Electromagnetic Compatibility (2014, Raleigh, NC)
  • Pratik Maheshwari
  • Victor Khilkevich, Missouri University of Science and Technology
  • David Pommerenke, Missouri University of Science and Technology
  • Hamed Kajbaf
  • Jin Min
Abstract
This paper presents the utilization of the emission source microscopy (ESM) technique to localize active sources of radiation on a PCB. For complex and large systems with multiple sources, localizing the sources of radiation often proves difficult. Near-field scanning provides limited information about the components contributing to far-field radiation. Two-dimensional synthetic aperture radar, a well-known technique used to diagnose and align phase array antennas, is adapted as emission source microscopy and utilized here for this alternative application. This paper presents the source localization methodology, along with simulation and measurement results. The results show that the proposed method can detect multiple active sources on a complex PCB.
Meeting Name
2014 IEEE International Symposium on Electromagnetic Compatibility (2014: Aug. 3-8, Raleigh, NC)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Antenna arrays,
  • Antenna phased arrays,
  • Polychlorinated biphenyls,
  • Synthetic aperture radar,
  • EMI,
  • Emission sources,
  • Near-field scanning,
  • SAR,
  • Source localization,
  • Electromagnetic compatibility,
  • emission source microscopy
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
9-1-2014
Citation Information
Pratik Maheshwari, Victor Khilkevich, David Pommerenke, Hamed Kajbaf, et al.. "Application of Emission Source Microscopy Technique to EMI Source Localization above 5 GHz" Proceedings of the 2014 IEEE International Symposium on Electromagnetic Compatibility (2014, Raleigh, NC) Vol. 2014-September Iss. September (2014) p. 7 - 11 ISSN: 1077-4076
Available at: http://works.bepress.com/david-pommerenke/46/