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Article
Automated Near-Field Scanning to Identify Resonances
Proceedings of the 2008 International Symposium on Electromagnetic Compatibility - EMC Europe
  • Giorgi Muchaidze
  • Huang Wei
  • Jin Min
  • Shao Peng
  • James L. Drewniak, Missouri University of Science and Technology
  • David Pommerenke, Missouri University of Science and Technology
Abstract
Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.
Meeting Name
2008 International Symposium on Electromagnetic Compatibility - EMC Europe
Department(s)
Electrical and Computer Engineering
Second Department
Materials Science and Engineering
Keywords and Phrases
  • EMI,
  • ESD,
  • Near Field Scanning
Library of Congress Subject Headings
Resonance
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
9-1-2008
Citation Information
Giorgi Muchaidze, Huang Wei, Jin Min, Shao Peng, et al.. "Automated Near-Field Scanning to Identify Resonances" Proceedings of the 2008 International Symposium on Electromagnetic Compatibility - EMC Europe (2008)
Available at: http://works.bepress.com/david-pommerenke/45/