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Article
Automated Near-Field Scanning to Identify Resonances
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility: EMC Europe (2008, Hamburg, Germany)
  • Giorgi Muchaidze
  • Huang Wei
  • Jin Min
  • Shao Peng
  • James L. Drewniak, Missouri University of Science and Technology
  • David Pommerenke, Missouri University of Science and Technology
Abstract
Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2008: Sep. 8-12, Hamburg, Germany)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • Resonance,
  • Electromagnetic Interference,
  • Immunity Testing,
  • Coupling Circuits,
  • Electromagnetic Compatibility,
  • Electrostatic Discharge,
  • Integrated Circuit Noise,
  • Clocks,
  • Cables,
  • Frequency,
  • EMI,
  • Near Field Scanning,
  • ESD,
  • Data Exchanges,
  • Electronic Systems,
  • File Formats,
  • Immunity Analysis,
  • Near Field Scanning,
  • Near Fields,
  • Standardized Methods,
  • System Analysis,
  • Electric Inverters,
  • Electromagnetic Pulse,
  • Electrostatic Devices,
  • Plastic Molds,
  • Resonance,
  • Scanning
International Standard Book Number (ISBN)
9781424427376
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
9-1-2008
Citation Information
Giorgi Muchaidze, Huang Wei, Jin Min, Shao Peng, et al.. "Automated Near-Field Scanning to Identify Resonances" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility: EMC Europe (2008, Hamburg, Germany) (2008) ISSN: 2325-0356; 2325-0364
Available at: http://works.bepress.com/david-pommerenke/45/