Automated Near-Field Scanning to Identify ResonancesProceedings of the 2008 International Symposium on Electromagnetic Compatibility - EMC Europe
AbstractNear-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.
Meeting Name2008 International Symposium on Electromagnetic Compatibility - EMC Europe
Department(s)Electrical and Computer Engineering
Second DepartmentMaterials Science and Engineering
Keywords and Phrases
- Near Field Scanning
Library of Congress Subject HeadingsResonance
Document TypeArticle - Conference proceedings
Document VersionFinal Version
Rights© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Citation InformationGiorgi Muchaidze, Huang Wei, Jin Min, Shao Peng, et al.. "Automated Near-Field Scanning to Identify Resonances" Proceedings of the 2008 International Symposium on Electromagnetic Compatibility - EMC Europe (2008)
Available at: http://works.bepress.com/david-pommerenke/45/