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Article
Application and Limits of IC and PCB Scanning Methods for Immunity Analysis
Proceedings of the 18th International Zurich Symposium on Electromagnetic Compatibility, 2007. EMC Zurich 2007
  • Qing Cai
  • Jin Min
  • Giorgi Muchaidze
  • David Pommerenke, Missouri University of Science and Technology
Abstract
Immunity scanning methods can be used to locate sensitive areas on PCBs and ICs. For the analysis of emissions near field scanning is used to determine the local field strength. Both methods have many similarities and differences. For both methods it is difficult to correlate between board level scanning and system level test results as neither method shows the coupling path directly. The paper shows the implementation of an immunity scanning system and analyzes the advantages and limitations of immunity near field scanning.
Meeting Name
18th International Zurich Symposium on Electromagnetic Compatibility, 2007. EMC Zurich 2007
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Immunity Scanning System
Library of Congress Subject Headings
Integrated circuits
Printed circuits
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
1-1-2007
Citation Information
Qing Cai, Jin Min, Giorgi Muchaidze and David Pommerenke. "Application and Limits of IC and PCB Scanning Methods for Immunity Analysis" Proceedings of the 18th International Zurich Symposium on Electromagnetic Compatibility, 2007. EMC Zurich 2007 (2007)
Available at: http://works.bepress.com/david-pommerenke/43/