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Article
An Experimental Investigation of Higher Order Mode Suppression in TEM Cells
IEEE Transactions on Electromagnetic Compatibility
  • Shaowei Deng
  • David Pommerenke, Missouri University of Science and Technology
  • Todd H. Hubing, Missouri University of Science and Technology
  • Dongshik Shin
Abstract
Transverse electromagnetic (TEM) cells can be used to evaluate the electric and magnetic fields coupling from integrated circuits (ICs). The propagation and reflection of higher order modes in the cells limits the bandwidth of TEM cells. This paper investigates several methods for suppressing higher order modes in TEM cells in order to extend the applicable frequency range without changing the test topology. Numerical models and measurements of a modified TEM cell demonstrate how higher order mode suppression techniques can extend the useful frequency range of a TEM cell for IC measurements from 1 to 2.5 GHz.
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Higher Order Mode,
  • Resonant Frequency,
  • Slotted Septum,
  • Transverse Electromagnetic (TEM) Cell
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
5-1-2008
Citation Information
Shaowei Deng, David Pommerenke, Todd H. Hubing and Dongshik Shin. "An Experimental Investigation of Higher Order Mode Suppression in TEM Cells" IEEE Transactions on Electromagnetic Compatibility (2008)
Available at: http://works.bepress.com/david-pommerenke/35/