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Advanced Full Wave ESD Generator Model for System Level Coupling Simulation
Proceedings of the 2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
  • Qing Cai
  • Argha Nandy
  • David Pommerenke, Missouri University of Science and Technology
  • Jong-Sung Lee
  • Byong-Su Seol
  • Jayong Koo
Abstract
System level ESD tests can only be performed after hardware is available. Simulating the ESD coupling into a circuit allows at least parametric and quantitative studies of the expected ESD behavior. A complete simulation requires us to model the ESD generator, the passive elements of the DUT and the response of the ICs to injected noise. Having the ultimate objective of combining IC soft error response models with the DUT structure and the ESD generator we report on progresses in modeling the ESD generator and its coupling. The model improves the useful frequency range from a few hundred MHz to about 3 GHz.
Meeting Name
2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Electrostatic Discharge,
  • Numerical Modeling
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2008
Citation Information
Qing Cai, Argha Nandy, David Pommerenke, Jong-Sung Lee, et al.. "Advanced Full Wave ESD Generator Model for System Level Coupling Simulation" Proceedings of the 2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008 (2008)
Available at: http://works.bepress.com/david-pommerenke/28/