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Article
Active Probes for Creating H-Field Probes for Flat Frequency Response
Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2009, Austin, TX)
  • Surbhi Mittal
  • Ji Zhang
  • David Pommerenke, Missouri University of Science and Technology
  • James L. Drewniak, Missouri University of Science and Technology
  • Kuifeng Hu
  • Xiaopeng Dong
Abstract
This paper presents an approach to obtain a flat frequency response from the first order derivative behavior of an electrically small loop and electrically short electric field probe by using them in combination with active oscilloscope probes. An H-field probe made in flex circuit technology was designed to operate up to about 5 GHz. These probes have loop dimensions as small as 3 × 3 mil and trace widths in the order of 1.75 mils. The H-field probe terminals are connected to the differential amplifier of the active oscilloscope probe which functions as an integrator to achieve a flat frequency response. The integrator behavior compensates for the first order derivative response of the flex circuit probes. The E-field probe utilizes the high input impedance of the browser attached to the active probe for achieving a flat frequency response.
Meeting Name
IEEE International Symposium on Electromagnetic Compatbility (2009: Aug. 17-21, Austin, TX)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • Active Probe,
  • E-Field,
  • First Order Derivatives,
  • Flat Frequency Response,
  • Flex Circuits,
  • High Input Impedance,
  • Cathode Ray Oscilloscopes,
  • Differential Amplifiers,
  • Electric Fields,
  • Electric Impedance,
  • Electromagnetic Compatibility,
  • Integrated Circuits,
  • Oscillographs,
  • Plastic Molds,
  • Probes,
  • Ultrasonic Devices,
  • Frequency Response,
  • Flexible Electronics,
  • Oscilloscopes,
  • Radio Frequency,
  • Coupling Circuits,
  • Connectors,
  • Frequency Conversion,
  • Circuit Testing,
  • Flex Circuit Technology,
  • Active Probes,
  • H-Field Probes,
  • First Order Derivative Behavior,
  • Electrically Short Electric Field Probe,
  • E-Dot Sensor,
  • H-Dot Sensor,
  • Integrator,
  • Derivative
International Standard Book Number (ISBN)
9781424442669
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2009
Citation Information
Surbhi Mittal, Ji Zhang, David Pommerenke, James L. Drewniak, et al.. "Active Probes for Creating H-Field Probes for Flat Frequency Response" Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2009, Austin, TX) (2009) p. 12 - 17 ISSN: 2158-110X; 2158-1118
Available at: http://works.bepress.com/david-pommerenke/27/