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Article
A Resonant E-field Probe for RFI Measurements
IEEE Transactions on Electromagnetic Compatibility
  • Guanghua Li
  • Koichi Itou
  • Yoshihiro Katou
  • Noriyuki Mukai
  • David Pommerenke, Missouri University of Science and Technology
  • Jun Fan, Missouri University of Science and Technology
Abstract

Near-field probes with high sensitivity facilitate the identification of the root causes of intrasystem radio frequency interference issues, where weak noise desensitizes the receiver. In the study presented in this paper, a high-sensitivity resonant electric field probe was designed, consisting of an LC resonator loaded by quarter-wave transformers for optimal power transfer at the resonant frequency. Based on the equivalent circuit model, analytical derivations and numerical simulations were performed to illustrate the design methodology. The simulation results agreed well with the measured values. At the resonant frequency of 1.577 GHz, the measured /S21/ from a matched trace to the resonant probe was approximately 6.6 dB higher than that of an equivalently sized broadband probe.

Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Keywords and Phrases
  • Circuit simulation,
  • Computer simulation,
  • Electric fields,
  • High frequency transformers,
  • Natural frequencies,
  • Power transformers,
  • Radio frequency identification (RFID),
  • Design Methodology,
  • Enhanced sensitivity,
  • Equivalent circuit model,
  • Impedance transformers,
  • Optimal power transfer,
  • Quarter Wave Transformer,
  • Radio frequency interference,
  • RF interference,
  • Probes,
  • receiver desensitization
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
12-1-2014
Citation Information
Guanghua Li, Koichi Itou, Yoshihiro Katou, Noriyuki Mukai, et al.. "A Resonant E-field Probe for RFI Measurements" IEEE Transactions on Electromagnetic Compatibility Vol. 56 Iss. 6 (2014) p. 1719 - 1722 ISSN: 189375
Available at: http://works.bepress.com/david-pommerenke/20/