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Article
A Passive Coupling Circuit for Injecting TLP-Like Stress Pulses into Only One End of a Driver/Receiver System
Proceedings of the 37th Electrical Overstress/Electrostatic Discharge Symposium (2015, Reno, NV)
  • Benjamin Orr
  • David Johnsson
  • Krzysztof Domański
  • Harald Gossner
  • David Pommerenke, Missouri University of Science and Technology
Abstract
In this paper, a simple passive circuit is presented which allows TLP stress and characterization pulses to be injected into only one side of a driver/receiver system. The circuit is simulated and tested, demonstrating the possibility for directional current injection on the order of 60:1. The circuit also provides a method for measuring both injected currents when paired with a typical TLP system.
Meeting Name
37th Electrical Overstress/Electrostatic Discharge Symposium (2015: Sep. 27-Oct. 2, Reno, NV)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Reconfigurable hardware,
  • Current injections,
  • Injected current,
  • Passive coupling,
  • Stress pulse,
  • TLP stress,
  • Passive networks
International Standard Book Number (ISBN)
978-158537273-7
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 ESD Association, All rights reserved.
Publication Date
10-1-2015
Citation Information
Benjamin Orr, David Johnsson, Krzysztof Domański, Harald Gossner, et al.. "A Passive Coupling Circuit for Injecting TLP-Like Stress Pulses into Only One End of a Driver/Receiver System" Proceedings of the 37th Electrical Overstress/Electrostatic Discharge Symposium (2015, Reno, NV) Vol. 2015-October (2015) ISSN: 0739-5159
Available at: http://works.bepress.com/david-pommerenke/19/