The Repeatability of System Level ESD Test and Relevant ESD Generator ParametersProceedings of the 2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
AbstractSome system level ESD tests do not repeat well if different ESD generators are used. For improving the test repeatability, ESD generator specifications were considered to be changed and a world wide Round Robin test were performed in 2006 to compare the modified and unmodified ESD generators. The test results show the failure level variations up to 1:3 for an EUT among eight different ESD generators. Multiple ESD parameters including discharge currents and transient fields have been measured. This paper tries to find which parameters would predict the failure level the best in general. The transient fields show large variations among different ESD generators. The voltage induced in a semi-circular loop and the ringing after first discharge current peak show the best correlation to failure levels. The regulation on the transient field is expected to improve the test repeatability.
Meeting Name2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
Department(s)Electrical and Computer Engineering
Keywords and Phrases
- ESD Parameters,
- Electrostatic Discharge,
- Failure Levels,
- Round Robin Test
Document TypeArticle - Conference proceedings
Document VersionFinal Version
Rights© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Citation InformationJayong Koo, Qing Cai, David Pommerenke, Kai Wang, et al.. "The Repeatability of System Level ESD Test and Relevant ESD Generator Parameters" Proceedings of the 2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008 (2008)
Available at: http://works.bepress.com/david-pommerenke/188/