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The Development of an EM-Field Probing System for Manual Near-Field Scanning
IEEE Transactions on Electromagnetic Compatibility
  • Hui He
  • Pratik Maheshwari
  • David Pommerenke, Missouri University of Science and Technology

This research was conducted to visualize the frequency-dependent electromagnetic field distribution for electromagnetic compatibility (EMC) applications and the time evolution of the current flow induced by an electrostatic discharge (ESD) on complex-shaped electronic systems. These objectives were achieved by combining magnetic field probing with a system that automatically records the probe's position and orientation. The local magnetic field associated with the probe location was recorded and displayed at near real time on the captured 3-D geometry. Consequently, a field strength map was obtained for EMC applications. Also, a video showing the spreading of the ESD-induced current with subnanosecond resolution was captured for ESD applications after the ESD-induced surface current density associated with the probe location was recorded.

Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
  • Electric discharges,
  • Electromagnetic compatibility,
  • Electromagnetic fields,
  • Electrostatic discharge,
  • Magnetic fields,
  • Probes,
  • Electromagnetic field distribution,
  • Electronic systems,
  • Frequency dependent,
  • Local magnetic field,
  • Near-field scanning,
  • Position and orientations,
  • Sub nanoseconds,
  • Surface current density,
  • Electrostatic devices,
  • electromagnetic interference (EMI) scan,
  • manual scan
Document Type
Article - Journal
Document Version
File Type
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
Citation Information
Hui He, Pratik Maheshwari and David Pommerenke. "The Development of an EM-Field Probing System for Manual Near-Field Scanning" IEEE Transactions on Electromagnetic Compatibility Vol. 58 Iss. 2 (2016) p. 356 - 363 ISSN: 0018-9375
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