Susceptibility Scanning as Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) ProblemsIEEE Transactions on Electromagnetic Compatibility
AbstractSusceptibility scanning is an increasingly adopted method for root cause analysis of system-level immunity sensitivities. It allows localizing affected nets and integrated circuits (ICs). Further, it can be used to compare the immunity of functionally identical or similar ICs or circuit boards. This paper explains the methodology as applied to electrostatic discharge and provides examples of scan maps and signals probed during immunity scanning. Limitations of present immunity analysis methods are discussed.
Department(s)Electrical and Computer Engineering
Second DepartmentMaterials Science and Engineering
Keywords and Phrases
- Electrostatic Discharges (ESDs),
Library of Congress Subject HeadingsImmunity
Document TypeArticle - Journal
Document VersionFinal Version
Rights© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Citation InformationMuchaidze Giorgi, Jayong Koo, Qing Cai, Tun Li, et al.. "Susceptibility Scanning as Failure Analysis Tool for System-Level Electrostatic Discharge (ESD) Problems" IEEE Transactions on Electromagnetic Compatibility (2008)
Available at: http://works.bepress.com/david-pommerenke/180/