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Article
Phase-Resolved Near-Field Scan Over Random Fields
IEEE Transactions on Electromagnetic Compatibility
  • Tianqi Li
  • Victor Khilkevich, Missouri University of Science and Technology
  • David Pommerenke, Missouri University of Science and Technology
Abstract
This letter discusses an averaging technique for phase-resolved scanning of the fields generated by multiple uncorrelated stochastic sources. This method can separate the field contribution of each noise source into the resulting field patterns as if the sources that are not of interest were turned off. The scanned data can be used to localize the emission sources and to calculate the far-field pattern and total radiated power.
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Condensed matter physics,
  • Electromagnetic compatibility,
  • Averaging technique,
  • Emission sources,
  • Far-field patterns,
  • Field patterns,
  • Near-field scan,
  • Phase-resolved,
  • Random fields,
  • Total radiated power,
  • Stochastic systems,
  • emission source microscopy
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
4-1-2016
Citation Information
Tianqi Li, Victor Khilkevich and David Pommerenke. "Phase-Resolved Near-Field Scan Over Random Fields" IEEE Transactions on Electromagnetic Compatibility Vol. 58 Iss. 2 (2016) p. 506 - 511 ISSN: 0018-9375
Available at: http://works.bepress.com/david-pommerenke/163/