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Article
Prediction of Electrostatic Discharge (ESD) Soft Error on Two-way Radio using ESD Simulation in CST and ESD Immunity Scanning Technique
Proceedings of the 36th IEEE International Electronics Manufacturing Technology Conference (2014, Malaysia)
  • Rosnah Antong
  • Danny Low
  • David Pommerenke, Missouri University of Science and Technology
  • Mohd Zaid Abdullah
Abstract
Electrostatic Discharge (ESD) can cause ESD soft error failures such as radio reset. In this paper, a new methodology is developed to assess ESD risk at system level prior to PCB fabrication using 3D simulation. A Poynting vector theorem is used to calculate the accumulated incident power received by the sensitive IC which is identified through ESD immunity scanning test. The time-weighted-Average peak power is to establish the criteria for ESD risk causing the soft error failure. Results from this paper will help electrical engineer to predict potential ESD reset failure at system level instead of the previously trial-And-error procedure.
Meeting Name
36th IEEE International Electronics Manufacturing Technology Conference (2014: Nov. 11-13, Johor, Malaysia)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Electromagnetic waves,
  • Electrostatic discharge,
  • Electrostatics,
  • Errors,
  • Industrial electronics,
  • Manufacture,
  • Outages,
  • Printed circuit boards,
  • Radiation hardening,
  • Risk assessment,
  • 3D simulations,
  • Incident power,
  • PCB fabrication,
  • Poynting vectors,
  • Scanning techniques,
  • Time-weighted averages,
  • Trial-and-error procedures,
  • Two-way radio,
  • Electrostatic devices
International Standard Book Number (ISBN)
978-147998209-7
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
6-1-2015
Citation Information
Rosnah Antong, Danny Low, David Pommerenke and Mohd Zaid Abdullah. "Prediction of Electrostatic Discharge (ESD) Soft Error on Two-way Radio using ESD Simulation in CST and ESD Immunity Scanning Technique" Proceedings of the 36th IEEE International Electronics Manufacturing Technology Conference (2014, Malaysia) Vol. 2015-June (2015) ISSN: 1089-8190
Available at: http://works.bepress.com/david-pommerenke/162/