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Article
Orthogonal Loops Probe Design and Characterization for Near-Field Measurement
Proceedings of the 2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
  • Tun Li
  • Yong Cheh Ho
  • David Pommerenke, Missouri University of Science and Technology
Abstract
Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx- Hy- and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements.
Meeting Name
2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • Electromagnetic Interference,
  • Orthogonal Loops,
  • Phase Shifting
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2008
Citation Information
Tun Li, Yong Cheh Ho and David Pommerenke. "Orthogonal Loops Probe Design and Characterization for Near-Field Measurement" Proceedings of the 2005 International Symposium on Electromagnetic Compatibility, 2008. EMC 2008 (2008)
Available at: http://works.bepress.com/david-pommerenke/159/