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Numerical Modeling of Electrostatic Discharge Generators
IEEE Transactions on Electromagnetic Compatibility
  • Kai Wang
  • David Pommerenke, Missouri University of Science and Technology
  • Thomas Van Doren, Missouri University of Science and Technology
  • James L. Drewniak, Missouri University of Science and Technology
  • A. Shashindranath
  • Ramachandran Chundru
The discharge current and the transient fields of an electrostatic discharge (ESD) generator in the contact mode are numerically simulated using the finite-difference time-domain method. At first the static field is established. Then the conductivity of the relay contact is changed, which initiates the discharge process. The simulated data are used to study the effect of design choices on the current and fields. They are compared to measured field and current data using a multidecade broadband field and current sensors. The model allows accurate prediction of the fields and currents of ESD generators, thus it can be used to evaluate different design choices.
Electrical and Computer Engineering
Keywords and Phrases
  • E-Field Sensor,
  • FDTD,
  • H-Field Sensor,
  • Charge Measurement,
  • Contact Mode,
  • Current Sensors,
  • Discharge Current,
  • Electric Current Measurement,
  • Electric Field Measurement,
  • Electric Sensing Devices,
  • Electromagnetic Compatibility,
  • Electrostatic Devices,
  • Electrostatic Discharge,
  • Electrostatic Discharge Generators,
  • Finite Difference Time-Domain Analysis,
  • Finite-Difference Time-Domain Method,
  • Multidecade Broadband Field,
  • Numerical Modeling,
  • Numerical Simulation,
  • Relay Contact Conductivity,
  • Simulated Data,
  • Static Field,
  • Transient Fields
Document Type
Article - Journal
Document Version
Final Version
File Type
© 2003 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
Citation Information
Kai Wang, David Pommerenke, Thomas Van Doren, James L. Drewniak, et al.. "Numerical Modeling of Electrostatic Discharge Generators" IEEE Transactions on Electromagnetic Compatibility (2003) ISSN: 0018-9375
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