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Article
Mode Suppressed TEM Cell Design for High Frequency IC Measurements
Proceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility
  • Daryl G. Beetner, Missouri University of Science and Technology
  • Shaowei Deng
  • James L. Drewniak, Missouri University of Science and Technology
  • Todd H. Hubing, Missouri University of Science and Technology
  • Sungnam Kim
  • Hocheol Kwak
  • David Pommerenke, Missouri University of Science and Technology
  • Dongshik Shin
Abstract
TEM cells or GTEM cells can be used to evaluate the radiated emissions of integrated circuits (ICs). The applicable frequency bandwidth of a TEM cell is limited due to the resonances of higher order modes. This paper describes how a TEM cell can be modified to extend the frequency range without changing the test topology. Several methods are proposed and implemented to suppress the higher order modes. The magnetic field coupling and electric field coupling are evaluated for the new design. The frequency bandwidth of the modified TEM cell is extended from original 1 GHz to 2. 5 GHz.
Meeting Name
2007 IEEE International Symposium on Electromagnetic Compatibility
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • TEM Cells,
  • Higher Order Mode
Document Type
Article - Journal
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
1-1-2007
Citation Information
Daryl G. Beetner, Shaowei Deng, James L. Drewniak, Todd H. Hubing, et al.. "Mode Suppressed TEM Cell Design for High Frequency IC Measurements" Proceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility (2007)
Available at: http://works.bepress.com/david-pommerenke/139/