Mode Suppressed TEM Cell Design for High Frequency IC MeasurementsProceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility
AbstractTEM cells or GTEM cells can be used to evaluate the radiated emissions of integrated circuits (ICs). The applicable frequency bandwidth of a TEM cell is limited due to the resonances of higher order modes. This paper describes how a TEM cell can be modified to extend the frequency range without changing the test topology. Several methods are proposed and implemented to suppress the higher order modes. The magnetic field coupling and electric field coupling are evaluated for the new design. The frequency bandwidth of the modified TEM cell is extended from original 1 GHz to 2. 5 GHz.
Meeting Name2007 IEEE International Symposium on Electromagnetic Compatibility
Department(s)Electrical and Computer Engineering
Keywords and Phrases
- TEM Cells,
- Higher Order Mode
Document TypeArticle - Journal
Document VersionFinal Version
Rights© 2007 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Citation InformationDaryl G. Beetner, Shaowei Deng, James L. Drewniak, Todd H. Hubing, et al.. "Mode Suppressed TEM Cell Design for High Frequency IC Measurements" Proceedings of the 2007 IEEE International Symposium on Electromagnetic Compatibility (2007)
Available at: http://works.bepress.com/david-pommerenke/139/