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Article
Laser Optical In-circuit Measurement System for Immunity Applications
Proceedings of the 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006
  • Chong Ding
  • David Pommerenke, Missouri University of Science and Technology
Abstract
During immunity testing (ESD, EFT) of a digital circuit, the waveforms of critical signal nets need to be measured for analyzing the failure mechanism. However, it is difficult to measure the induced voltage in the circuit under test due to the unwanted coupling by the non-ideal shielding of the probe cable, especially, if large common mode currents are present. Fiber optical connection avoids this problem. Semiconductor lasers have frequently been used for converting the voltage into an optical signal. The paper shows novel implementations of powering the laser, leading to a small, low cost optical probe.
Meeting Name
2006 IEEE International Symposium on Electromagnetic Compatibility, 2006
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
  • EM Coupling,
  • Non-Ideal Shielding,
  • Optical Link,
  • Susceptibility Test
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2006 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
1-1-2006
Citation Information
Chong Ding and David Pommerenke. "Laser Optical In-circuit Measurement System for Immunity Applications" Proceedings of the 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006 (2006)
Available at: http://works.bepress.com/david-pommerenke/129/