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Article
Jitter: Basics, Relevance and Measurement Methods
IEEE International Symposium on Electromagnetic Compatibility, 2008. EMC 2008
  • David Pommerenke, Missouri University of Science and Technology
Department(s)
Electrical and Computer Engineering
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2008 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
8-1-2008
Citation Information
David Pommerenke. "Jitter: Basics, Relevance and Measurement Methods" IEEE International Symposium on Electromagnetic Compatibility, 2008. EMC 2008 (2008)
Available at: http://works.bepress.com/david-pommerenke/128/